So far the edge channel (EC) picture has been successfully
used to explain the plateau values of the IQHE. In addition, for the case
of EC back scattering, which is induced by a gate electrode in depletion
mode, the EC picture on the basis of the Landauer-Büttiker (LB) formalism
gives also correct values for the finite longitudinal resistance Rxx,
provided that the involved ECs are either fully reflected or transmitted.
This means that the bulk region below and outside the gate has to be insulating
(plateau regime below and outside the gate). The situation gets more complicated
if the bulk below and/or outside the gated region undergoes a QHE plateau-to-plateau
transition. In this case edge and bulk currents occur simultaneously and
the LB formula cannot be applied directly. The problem of a simultaneous
occurrence of edge and dissipative bulk currents was recently successfully
addressed by an alternative representation of back scattering in the EC-picture[1,2].
In this presentation we show, that this back scattering approach allows
to calculate the resistance components Rxx and Rxy
as well as the potential distribution in the bulk for actual sample geometry's.
The key point is that this back scattering approach allows also to treat
the coupling between EC-pairs like it occurs by tunneling between magnetically
bound states at the saddle points of long range potential fluctuations
in the bulk. Thus, it is possible to use this modified LB-like formalism
also for describing the nodes of a Chalker-Coddington-like network representation
of bulk transport in the high magnetic field limit. However, the essential
difference to the Chalker-Coddington network is that we use the above mentioned
back scattering formulation instead of a transfer matrix for describing
the nodes[3]. The coupling (tunneling) at the nodes depends exponentially
on the position of the Fermi level with respect to the saddle point energy.
This finally means, that the coupling at the nodes of the network depends
exponentially on the filling factor at the lateral location of the node.
In this way we get a handle for including a lateral electron density profile
within the network. This allows us to define realistic sample structures
by shaping the lateral carrier density profile to e.g. a Hall bar with
realistic contact arms and side depletion zones. Further more it is possible
to model inhomogeneities like introduced e.g. by a gate electrode across
the Hall bar.
Figure: Typical density profile, which is distributed over the nodes
of the grid, which allows to calculate a local filling factor. At the same
time it is shown, how a gate across the Hallbar can be created.
Each involved LL is represented by a complete network and all LLs are interconnected at the location of the metallic contacts (voltage probes and current contacts). The network is solved numerically and allows to study almost arbitrarily shaped samples including non-local and Corbino geometry. Besides the transport data, our network model delivers also the lateral potential distribution for each LL, which will be used for the animated examples.
[1] J.Oswald, G. Span, F. Kuchar, Phys. Rev. B58, 15401-15404 (1998)
[2] J.Oswald, "A New Model for the Transport Regime of the Integer Quantum
Hall Effect: The Role of Bulk Transport in the Edge Channel Picture", Proc.
10th Int. Winterschool on New Developments in Solid State Physics, Mauterndorf,
23-27 Feb. 1998, Salzburg, Austria (invited), Physica E3, 30-37 (1998)
(for a preprint click here)
[3] J. Oswald, "A Novel networkmodel for the Hall Insulator", Proc.
4th Int. Symp. on New Phenomena in Mesoscopic Structures" Dec. 6-11 1998,
Kauai, Hawaii, USA. , in print (for a preprint click here)
Edge channel reflection at a gate electrode
A gate electrode is simulated like shown in the figure above. The carrier
density below the gate is depleted to 50% of the carrierdensity outside
the gate. In this situation a special condition occurs if the fillingfator
outside the gate is n = 4 and n
=
2 because in this cases the fillingfactor below the gate gets nG =
2 and nG =1 respectively. This means for
n
=
4 two edge channels get transmitted through the gate and 2 edge channels
get reflected. In the case n
= 2 one edge channel
gets transmitted and one reflected. The simulation shows the potential
distribution in the second Landau level while the magnetic field sweeps
in a way that the fillingfactor n changes from
n = 4 to n
= 2. This
means that at the beginning the 2nd Landau level should create a transmitted
EC while at the end of the feld sweep it should create a reflected EC.
Supported by Österreichische Nationalbank
- Jubiläumsfonds Project No. 6566